SiliconEngIntegrated circuit development

SILICONENG RESOURCES

Useful insight for the work between silicon and production.

Practical guidance for analog and power IC test development, from datasheet review to production release, written by the engineers who do the work.

Browse white papers

TECHNICAL NOTES

White papers

Practical methods and field-tested considerations for developing analog and power IC production tests. Start with the method, then read the companion field guide.

01 · Test program developmentStart here

From Datasheet to ATE: A Systematic Method for Power-IC Test Program Development

A four-stage method for turning a power-IC datasheet into a production test program with defensible limits and a written record of engineering decisions.

Inside this paper

  • Extraction, normalization, test planning, and guardbanded limits
  • Worked example: TI TPS7A20 low-noise LDO
  • An 18-question checklist to run before writing test code
  • A decision-log template
Read PDF Download

PDF · 14 pages · Version 2.7

02 · Analog and power testCompanion to 01

Analog and Power IC Test Development: A Field Guide to Pitfalls and Good Practice

A practical guide to the measurement errors and test-development traps that affect analog and power ICs, from instrument uncertainty to sockets, layout, and transient protection.

Inside this paper

  • The 10:1 test uncertainty rule and seven workarounds
  • Worked examples: TI TPS54360 buck and INA333 in‑amp
  • Sockets, layout, simulation, gauge R&R, and spike checks
  • A 14-point good-practice checklist
Read PDF Download

PDF · 19 pages · Version 1.8

NEED A TECHNICAL PARTNER?

Bring your next device into focus.

Questions about a paper, or a test program of your own? Our engineers are glad to talk it through.

Talk with an engineer